This research was supported by the Ministry of Trade, Industry & Energy and the Korea Evaluation Institute of Industrial Technology (KEIT) with the program number of 10060110
Publications
International Conference
Fine-scale Surface Normal Estimation using a Single NIR Image
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저 자 | Youngjin Yoon, Gyeongmin Choe, Namil Kim, Joon-Young Lee, In So Kweon |
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학 회 | European Conference on Computer Vision (ECCV) , October 2016 |
논문일시(Year) | 2016 |
논문일시(Month) | 10 |